Accès ouvert

Deep learning–assisted malaria microscopy with sensitivity-aware threshold optimization

Article scientifique 2026 Anglais

Résumé

Malaria microscopy becomes clinically risky when parasitized erythrocytes are missed, even when a classifier reports high overall accuracy. This study presents an artificial-intelligence-assisted malaria microscopy framework that explicitly optimizes the diagnostic operating point for sensitivity-aware screening. A balanced set of 27,558 National Institutes of Health/National Library of Medicine (NIH/NLM) thin-smear cell images was divided by stratified image-level sampling in the ratio 70:15:15 for training, validation, and independent testing. Two custom convolutional neural networks (CNNs) with complementary capacity–regularization profiles and an equal-weight score-level ensemble were evaluated. Training-only online augmentation, fixed input resizing, validation-only threshold selection, confidence intervals, and error analysis were incorporated to improve reproducibility. At the conventional threshold, the compact CNN achieved the highest accuracy (95.26%). After optimizing the operating point with the recall-weighted F 2 objective, the deeper CNN provided the strongest screening-oriented result on the held-out test set, reaching 97.05% sensitivity (95% confidence interval: 96.23%–97.70%), a 96.01% F 2 -score, a 2.95% false-negative rate, and a receiver-operating-characteristic area under the curve of 0.9876 (95% confidence interval: 0.9842–0.9910). It reduced missed parasitized cells from 177 to 61 relative to its default threshold. The public release does not provide patient identifiers; therefore, the reported split is image-level rather than confirmed to be patient-level independent, and external multicenter validation remains necessary before clinical deployment. The main finding is that the highest-accuracy classifier is not necessarily the most appropriate sensitivity-oriented screening configuration.

Citer ce document

Dehbi, F., Hamou, R., Menaouer, B., Sahmoud, S., Ghoul, A., Latreche, A., Djeffal, S. (2026). Deep learning–assisted malaria microscopy with sensitivity-aware threshold optimization. https://doi.org/10.3389/fmed.2026.1911275

Accès au document

Texte intégral en lecture en ligne, réservé aux abonnés SPHAERO et aux membres de l'institution. Se connecter

Voir l'article sur le site de la revue

Statistiques

Consultations : 1

Téléchargements : 0