Finding New Sources of Resistances from Durum Wheat Landraces Against Leaf Rusts (Puccinia triticina) and Studying Environmental Factors for Disease Development
Résumé
The use of genetic resistance is the key approach for rust management and ecological safety. Nowadays, the Puccinia triticina pathogens have virulent on most released durum wheat varities and break the resistance status of hosts through mutations and genetic recombination. To overcome the problems, mining of new resistances genes is inevitable. The aim of this study is searching new sources of resistance from durum wheat landraces to leaf rust and the influence of environmental factors for disease epidemiology. The 142 durum wheat landraces planted the simple lattice design with 12 blocks and 12 plots per replication and each plot size is 0.5 m X 1m. The disease spreader line planted at 1m intervals between blocks at the same sowing date. The natural occurrence of Puccinia triticina is highly epidemic at early stage and the data recorded started at the first symptom appear spreader lines. Totally 34 durum wheat landraces have been identified as adult plant resistance genes. Among them the seven durum wheat landraces (222428, 214348, 226860, 222705, 204391, 222454, 226882) have categorized the first group and the second twenty seven landraces (226893, 222389, 208189, 222680, 204586, 222552, 214527, 204363, 222435, 204521, 204463, 238132, 214606, 208191, 8063, 222764, 214264, 204432, 238131, 222553, 204555, 226889, 226965, 238128, 203968, 222560, 214312). These landraces considered as the high level of slow rusting and moderate level of partial resistance to reduce epidemics of leaf rust disease respectively. Utilizing these resistance sources for next leaf rust resistance breeding is crucial. The average weekly maximum temperature and relative air humidity is positively significant and negatively very highly significant (P<0.001) with leaf rust disease progress over time respectively. The AUDPC is very highly significant and negatively affect on days of heading, date of maturity and grain yield.
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